AP24N60MP

600V N-Channel Enhancement Mode MOSFET

AP24N60MP REV1.0

永源微電子科技有限公司

Electrical Characteristics (TJ=25℃, unless otherwise noted)

Symbol

Parameter

Test Conditions

Min

Typ

Max

Unit

V(BR)DSS

Drain-Source Breakdown Voltage

VGS = 0V, ID = 250µA

600

680

--

V

IDSS

Zero Gate Voltage Drain Current

VDS = 600V, VGS = 0V, TJ = 25ºC

--

--

1

μA

IGSS

Gate-Source Leakage

VGS = ±30V

--

--

±100

nA

VGS(th)

Gate-Source Threshold Voltage

VDS = VGS, ID = 250µA

2.0

3.0

4.0

V

RDS(on)

Drain-Source On-Resistance (Note3)

VGS = 10V, ID = 12.5A

--

260

350

mΩ

Ciss

Input Capacitance

VGS = 0V,

VDS = 25V, f = 1.0MHz

--

4008

--

pF

Coss

Output Capacitance

--

423

--

Crss

Reverse Transfer Capacitance

--

62

--

Qg

Total Gate Charge

VDS=480V, ID=24A,

VGS =10V

--

122

--

nC

Qgs

Gate-Source Charge

--

18

--

Qgd

Gate-Drain Charge

--

61

--

td(on)

Turn-on Delay Time

VDD=300V, ID=24A,

RG = 25 Ω

--

67

--

ns

tr

Turn-on Rise Time

--

53

--

td(off)

Turn-off Delay Time

--

522

--

tf

Turn-off Fall Time

--

94

--

IS

Continuous Body Diode Current

TC = 25 ºC

--

--

25

A

ISM

Pulsed Diode Forward Current

--

--

100

VSD

Body Diode Voltage

TJ = 25ºC, ISD = 12.5A, VGS = 0V

--

--

1.4

V

trr

Reverse Recovery Time

VGS = 0V,IS = 24A, diF/dt =100A

/μs

--

800

--

ns

Qrr

Reverse Recovery Charge

--

8.46

--

μC

Note :

1、The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.

2

、The EAS data shows Max. rating . L=4.1mH IAS=24A, VDD=50V, RG=25Ω, Starting TJ = 25 ºC

3

、The test condition is Pulse Test: Pulse width ≤ 300μs, Duty Cycle ≤ 1%

4

、The power dissipation is limited by 150℃ junction temperature

5

、The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.