STD4NK50ZD - STD4NK50ZD-1 - STF4NK50ZD - STP4NK50ZD

Electrical characteristics

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Table 7.

Source drain diode

Symbol

Parameter

Test condictions

Min

Typ.

Max

Unit

Source-drain current

3

A

(1)

1.

Pulse width limited by safe operating area

Source-drain current (pulsed)

12

A

(2)

2.

Pulsed: pulse duration=300µs, duty cycle 1.5%

Forward on voltage

1.6

V

Reverse recovery time

Reverse recovery charge

Reverse recovery current

di/dt = 100A/µs,

73

140

3.82

ns

nC

A

Reverse recovery time

Reverse Recovery Charge

Reverse recovery current

di/dt = 100A/µs,

118

260

4.4

ns

nC

A

Table 8.

Gate-source zener diode

Symbol

Parameter

Test condictions

Min.

Typ.

Max

Unit

(1)

1.

The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s

ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be

applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and

cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the

usage of external components.

Gate-source braekdown

voltage

30

V