Os motores de busca de Datasheet de Componentes eletrônicos
  Portuguese  ▼
ALLDATASHEETPT.COM

X  

LAN8808D Folha de dados(PDF) 54 Page - Microchip Technology

Nome de Peças LAN8808D
Descrição Electrónicos  4-Port Gigabit Ethernet Transceiver with QSGMII Support
PDF  80 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Fabricante Electrônico  MICROCHIP [Microchip Technology]
Página de início  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

LAN8808D Folha de dados(HTML) 54 Page - Microchip Technology

Back Button LAN8808D Datasheet HTML 50Page - Microchip Technology LAN8808D Datasheet HTML 51Page - Microchip Technology LAN8808D Datasheet HTML 52Page - Microchip Technology LAN8808D Datasheet HTML 53Page - Microchip Technology LAN8808D Datasheet HTML 54Page - Microchip Technology LAN8808D Datasheet HTML 55Page - Microchip Technology LAN8808D Datasheet HTML 56Page - Microchip Technology LAN8808D Datasheet HTML 57Page - Microchip Technology LAN8808D Datasheet HTML 58Page - Microchip Technology Next Button
Zoom Inzoom in Zoom Outzoom out
 54 / 80 page
background image
LAN8808D
DS00005833C-page 54
© 2026 Microchip Technology Inc. and its subsidiaries
• Variable I/O Power Supply (on VDDIO) set for ~1.5V (typical)
The POR circuits have a “dead zone” between bottom range of valid operational voltage and where POR trips (e.g., -
15%/20%). The Over/Under Voltage Protection enables tightening this range to just under the bottom of the supply
range.
5.20
JTAG
An IEEE 1149.1 compliant TAP Controller supports boundary scan and various test modes.
The device includes an integrated JTAG boundary-scan test port for board-level testing. The interface consists of four
pins (TDO, TDI, TCK and TMS) and includes a state machine, data register array and an instruction register. The JTAG
pins are described in Table 3-6. The JTAG interface conforms to the IEEE Standard 1149.1 - 2001 Standard Test Access
Port (TAP) and Boundary-Scan Architecture.
All input and output data is synchronous to the TCK test clock input. TAP input signals TMS and TDI are clocked into
the test logic on the rising edge of TCK, while the output signal TDO is clocked on the falling edge.
JTAG pins are multiplexed with the GPIO pins. The JTAG functionality is selected when the TESTMODE pin is asserted.
The implemented JTAG instructions and their OP Codes are shown in Table 5-11. JTAG timing information is provided
in Section 6.6.6, "JTAG Timing".
TABLE 5-11:
JTAG OP CODES
Instruction
OP Code
CLAMP
4’b0000
EXTEST
4’b0001
(RESERVED)
4’b0010
(RESERVED)
4’b0011
INTEST
4’b0100
SAMPLE_PRELOAD
4’b0101
HIGHZ
4’b0110
HOST-IJTAG ACCESS
4’b0111
ID CODE
4’b1000
BYPASS
4’b1001 to 4’b1111
Note:
The JTAG device ID is 00381445h.
Note:
All digital I/O pins support IEEE 1149.1 operation. Analog pins do not support IEEE 1149.1 operation.



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80


Folha de dados Download

Go To PDF Page


Ligação URL



ALLDATASHEET é útil para você?  [ DONATE ] 

Sobre Alldatasheet   |   Publicidade   |   Contato conosco   |   Privacy Policy   |   Link para a ficha técnica    |   roca de Link   |   Lista de Fabricantes
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com