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TPS2811 Folha de dados(PDF) 12 Page - Texas Instruments

Nome de Peças TPS2811
Descrição Electrónicos  DUAL HIGH-SPEED MOSFET DRIVER
PDF  32 Pages
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Fabricante Electrônico  TI2 [Texas Instruments]
Página de início  https://www.ti.com
Logo TI2 - Texas Instruments

TPS2811 Folha de dados(HTML) 12 Page - Texas Instruments

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Regulator
50 Ω
1
2
3
4
8
7
6
5
1 nF
Output
0.1 µF
4.7 µF
+
VCC
TPS2811
Regulator
50 Ω
1
2
3
4
8
7
6
5
CL(2)
CL(1)
Output 1
0.1 µF
4.7 µF
+
VCC
TPS2811
Output 2
TPS2811-Q1
SLVSAE0 – JUNE 2010
www.ti.com
Matching and Paralleling Connections
Figure 19 and Figure 20 show the delays for the rise and fall time of each channel. As can be seen on a 5-ns
scale, there is very little difference between the two channels at no load. Figures 23 and 24 show the difference
between the two channels for a 1-nF load on each output. There is a slight delay on the rising edge, but little or
no delay on the falling edge. As an example of extreme overload, Figures 25 and 26 show the difference
between the two channels, or two drivers in the package, each driving a 10-nF load. As would be expected, the
rise and fall times are significantly slowed down. Figures 28 and 29 show the effect of paralleling the two
channels and driving a 1-nF load. A noticeable improvement is evident in the rise and fall times of the output
waveforms. Finally, Figures 30 and 31 show the two drivers being paralleled to drive the 10-nF load and as could
be expected the waveforms are improved. In summary, the paralleling of the two drivers in a package enhances
the capability of the drivers to handle a larger load. Because of manufacturing tolerances, it is not recommended
to parallel drivers that are not in the same package.
Figure 19. Test Circuit for Measuring Switching Characteristics
A.
Input rise and fall times should be
≤10 ns for accurate measurement of ac parameters.
Figure 20. Test Circuit for Measuring Switching Characteristics With the Inputs Connected in Parallel
12
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Product Folder Link(s): TPS2811-Q1



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