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MMBZ30VCLDBZR Folha de dados(PDF) 4 Page - Texas Instruments

Nome de Peças MMBZ30VCLDBZR
Descrição Electrónicos  MMBZ30VCL Dual Channel ESD Protection
PDF  14 Pages
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Fabricante Electrônico  TI2 [Texas Instruments]
Página de início  https://www.ti.com
Logo TI2 - Texas Instruments

MMBZ30VCLDBZR Folha de dados(HTML) 4 Page - Texas Instruments

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5.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
TA
Operating free-air temperature
-55
150
°C
5.5 Thermal Information
THERMAL METRIC (1)
MMBZ30VCL
UNIT
DBZ (SOT-23)
3 PINS
RθJA
Junction-to-ambient thermal resistance
262.6
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
147.0
°C/W
RθJB
Junction-to-board thermal resistance
96.1
°C/W
ΨJT
Junction-to-top characterization parameter
33.5
°C/W
ΨJB
Junction-to-board characterization parameter
95.4
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
N/A
°C/W
(1)
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
5.6 Electrical Characteristics
over TA = 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VF
Forward Voltage
IF = 10mA, TA = 25°C
1.1
V
VRWM
Reverse stand-off voltage
TA = 25°C
24
V
VBR
Breakdown voltage (1)
IT = 10mA, TA = 25°C
24.8
34.8
V
VCLAMP
Clamping voltage (2)
IPPM = 0.5A, tp = 10/1000µs
31
40
V
ILEAK
Leakage current
VIO = ±24V
1
25
nA
SZ
Temperature Coefficient
IZ = 10mA
13
mV/C
CL
Line capacitance
VIO = 0V, f = 1MHz, Vpp = 30mV
4.5
pF
(1)
VBR is defined as the voltage when 10mA is applied and before the device enters into the shallow snapback state
(2)
Device stressed with 10/1000 µs exponential decay waveform according to IEC 61643-321
MMBZ30VCL
SLVSIA0 – NOVEMBER 2024
www.ti.com
4
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Product Folder Links: MMBZ30VCL



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