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ABSOLUTE MAXIMUM RATINGS

(1)

REF5020,, REF5025

REF5030, REF5040

REF5045, REF5050

SBOS410 – JUNE 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PRODUCT

OUTPUT VOLTAGE

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

STANDARD GRADE (8ppm, 0.1%)

SO-8

D

REF5020

REF5020A

2.048V

DGK

R50A

SO-8

D

REF5025

REF5025A

2.5V

DGK

R50B

SO-8

D

REF5030

REF5030A

3.0V

DGK

R50C

SO-8

D

REF5040

REF5040A

4.096V

DGK

R50D

SO-8

D

REF5045

REF5045A

4.5V

DGK

R50E

SO-8

D

REF5050

REF5050A

5.0V

DGK

R50F

HIGH GRADE (3ppm, 0.05%)

SO-8

D

REF5020

REF5020I

2.048V

DGK

R50A

SO-8

D

REF5025

REF5025I

2.5V

DGK

R50B

SO-8

D

REF5030

REF5030I

3.0V

DGK

R50C

SO-8

D

REF5040

REF5040I

4.096V

DGK

R50D

SO-8

D

REF5045

REF5045I

4.5V

DGK

R50E

SO-8

D

REF5050

REF5050I

5.0V

DGK

R50F

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

MSOP-8 (DGK) package available Q3, 2007.

PARAMETER

REF50xx

UNIT

Input Voltage

+18

V

Output Short-Circuit

30

mA

Operating Temperature Range

–55 to +125

°C

Storage Temperature Range

–55 to +150

°C

+150

°C

Human Body Model (HBM)

3000

V

ESD Rating

Charged Device Model (CDM)

1000

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

2

Copyright © 2007, Texas Instruments Incorporated

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