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MCP6001 Folha de dados(PDF) 10 Page - Microchip Technology

Nome de Peças MCP6001
Descrição Electrónicos  1 MHz, Low-Power Op Amp
PDF  28 Pages
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Fabricante Electrônico  MICROCHIP [Microchip Technology]
Página de início  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

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MCP6001/2/4
DS21733F-page 10
© 2005 Microchip Technology Inc.
4.6
Application Circuits
4.6.1
UNITY-GAIN BUFFER
The rail-to-rail input and output capability of the
MCP6001/2/4 op amp is ideal for unity-gain buffer
applications. The low quiescent current and wide
bandwidth makes the device suitable for a buffer
configuration in an instrumentation amplifier circuit, as
shown in Figure 4-6.
FIGURE 4-6:
Instrumentation Amplifier
with Unity-Gain Buffer Inputs.
4.6.2
ACTIVE LOW-PASS FILTER
The MCP6001/2/4 op amp’s low input bias current
makes it possible for the designer to use larger resis-
tors and smaller capacitors for active low-pass filter
applications. However, as the resistance increases, the
noise generated also increases. Parasitic capacitances
and the large value resistors could also modify the fre-
quency response. These trade-offs need to be
considered when selecting circuit elements.
Usually, the op amp bandwidth is 100X the filter cutoff
frequency (or higher) for good performance. It is possi-
ble to have the op amp bandwidth 10X higher than the
cutoff frequency, thus having a design that is more
sensitive to component tolerances.
Figure 4-7 shows a second-order Butterworth filter with
100 kHz cutoff frequency and a gain of +1 V/V; the op
amp bandwidth is only 10X higher than the cutoff
frequency. The component values were selected using
Microchip’s FilterLab® software.
FIGURE 4-7:
Active Second-Order
Low- Pass Filter.
4.6.3
PEAK DETECTOR
The MCP6001/2/4 op amp has a high input impedance,
rail-to-rail input/output and low input bias current, which
makes this device suitable for peak detector applica-
tions. Figure 4-8 shows a peak detector circuit with
clear and sample switches. The peak-detection cycle
uses a clock (CLK), as shown in Figure 4-8.
At the rising edge of CLK, Sample Switch closes to
begin sampling. The peak voltage stored on C1 is sam-
pled to C2 for a sample time defined by tSAMP. At the
end of the sample time (falling edge of Sample Signal),
Clear Signal goes high and closes the Clear Switch.
When the Clear Switch closes, C1 discharges through
R1 for a time defined by tCLEAR. At the end of the clear
time (falling edge of Clear Signal), op amp A begins to
store the peak value of VIN on C1 for a time defined by
tDETECT.
In order to define tSAMP and tCLEAR, it is necessary to
determine the capacitor charging and discharging
period. The capacitor charging time is limited by the
amplifier source current, while the discharging time (
τ)
is defined using R1 (
τ = R
1C1). tDETECT is the time that
the input signal is sampled on C1 and is dependent on
the input voltage change frequency.
The op amp output current limit, and the size of the
storage capacitors (both C1 and C2), could create slew-
ing limitations as the input voltage (VIN) increases.
Current through a capacitor is dependent on the size of
the capacitor and the rate of voltage change. From this
relationship, the rate of voltage change or the slew rate
can be determined. For example, with an op amp short-
circuit current of ISC = 25 mA and a load capacitor of
C1 = 0.1 µF, then:
EQUATION 4-1:
VIN1
R2
MCP6002
VIN2
R2
MCP6002
VREF
MCP6001
VOUT
R1
R1
+
+
+
1/2
1/2
V
OUT
V
IN2
V
IN1
()
R
1
R
2
------
V
REF
+
=
R1 = 20 kΩ
R2 = 10 kΩ
14.3 k
Ω
MCP6002
VOUT
53.6 k
Ω
100 pF
VIN
33 pF
+
dV
C1
dt
-------------
I
SC
C
1
--------
=
25mA
0.1
μF
---------------
=
dV
C1
dt
-------------
250mV
μs
=
I
SC
C
1
dV
C1
dt
-------------
=



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