OP07C, OP07D

PRECISION OPERATIONAL AMPLIFIERS

SLOS099E − OCTOBER 1983 − REVISED MAY 2004

1

POST OFFICE BOX 655303

Cost

...0 to

±14 V Typ

...

±3 V to ±18 V

description/ordering information

These devices offer low offset and long-term stability by means of a low-noise, chopperless,

bipolar-input-transistor amplifier circuit. For most applications, external components are not required for offset

nulling and frequency compensation. The true differential input, with a wide input-voltage range and outstanding

common-mode rejection, provides maximum flexibility and performance in high-noise environments and in

noninverting applications. Low bias currents and extremely high input impedances are maintained over the

entire temperature range. The OP07 is unsurpassed for low-noise, high-accuracy amplification of very-low-level

signals.

These devices are characterized for operation from 0

°C to 70°C.

ORDERING INFORMATION

TA

PACKAGE†

ORDERABLE

PART NUMBER

TOP-SIDE

MARKING

PDIP (P)

Tube of 50

OP07CP

OP07CP

PDIP (P)

Tube of 50

OP07DP

OP07DP

0

°C to 70°C

Tube of 75

OP07CD

OP07C

0

°C to 70°C

SOIC (D)

Reel of 2500

OP07CDR

OP07C

SOIC (D)

Tube of 75

OP07DD

OP07D

Reel of 2500

OP07DDR

OP07D

† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are

available at www.ti.com/sc/package.

symbol

OUT

−

+

OFFSET N2

IN−

IN+

OFFSET N1

1

3

2

8

6

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

1

2

3

4

8

7

6

5

OFFSET N1

IN−

IN+

OFFSET N2

OUT

NC

D OR P PACKAGE

(TOP VIEW)

NC − No internal connection

Copyright

 2004, Texas Instruments Incorporated

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.