SP3238CASLASHTR datasheet(16/19 Pages) SIPEX

16 / 19 page

Rev. 6/30/03

SP3238 Intelligent +3.0V to +5.5V RS-232 Transceiver

ESD TOLERANCE

The SP3238 device incorporates ruggedized

ESD cells on all driver output and receiver input

pins. The ESD structure is improved over our

previous family for more rugged applications

and environments sensitive to electro-static

discharges and associated transients.

The Human Body Model has been the generally

accepted ESD testing method for semiconductors.

This method is also specified in MIL-STD-883,

Method 3015.7 for ESD testing. The premise of

this ESD test is to simulate the human body’s

potential to store electro-static energy and

discharge it to an integrated circuit. The

simulation is performed by using a test model as

shown in Figure 19. This method will test the

IC’s capability to withstand an ESD transient

during normal handling such as in manufacturing

areas where the ICs tend to be handled frequently.

For the Human Body Model, the current limiting

resistor (R

S) and the source capacitor (CS) are

1.5k

Ω and 100pF, respectively.

Figure 19. ESD Test Circuit for Human Body Model

SW1

SW2

Device

Under

Test

DC Power

Source

SW1

SW2

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