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ADIN1110CCPZ-R7 Folha de dados(PDF) 23 Page - Analog Devices

Nome de Peças ADIN1110CCPZ-R7
Descrição Electrónicos  Robust, Industrial, Low Power 10BASE-T1L Ethernet MAC-PHY
PDF  104 Pages
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Fabricante Electrônico  AD [Analog Devices]
Página de início  http://www.analog.com
Logo AD - Analog Devices

ADIN1110CCPZ-R7 Folha de dados(HTML) 23 Page - Analog Devices

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Data Sheet
ADIN1110
ON-CHIP DIAGNOSTICS
analog.com
Rev. 0 | 23 of 104
TEST MODES
The ADIN1110 provides several test modes that allow testing of
the transmitter waveform, distortion, jitter, and droop. These test
modes change only the data symbols provided to the transmitter
circuitry and do not alter the electrical and jitter characteristics of
the transmitter and receiver from the normal operation.
The following test modes included in theADIN1110 are defined in
Subclause 146.5.2 from the IEEE 802.3cg:
Test Mode 1. This is a transmitter output voltage and timing jitter
test mode. When this mode is selected, the ADIN1110 repeatedly
transmits the data symbol sequence (+1, –1).
Test Mode 2. This is a transmitter output droop test mode. In this
mode, the ADIN1110 transmits ten +1 symbols followed by ten
−1 symbols. This sequence repeats indefinitely.
Test Mode 3. Normal operation in idle mode test mode. When
this test mode is selected, the ADIN1110 transmits as in non test
operation and in the master data mode with data set to normal
interframe idle signals.
In addition to these test modes, the ADIN1110 provides the trans-
mit disable mode defined in Subclause 45.2.1.186a.2. This mode
maintains both the receive and transmit path active as in normal
operation, but only transmits 0 symbols. This mode can be used to
measure the MDI return loss specified in Subclause 146.8.3.
Accessing Test Mode 1 to Test Mode 3
To set the ADIN1110 into Test Mode 1, Test Mode 2, or Test
Mode 3, the device must be in software power-down mode
(CRSM_SFT_PD). The power-down status of the ADIN1110
can be checked reading the software power-down status bit
(CRSM_SFT_PD_RDY).
When the ADIN1110 is in software power-down mode, disable
autonegotiation by clearing the autonegotiation enable bit (AN_EN).
With autonegotiation disabled, force the autonegotiation con-
figuration by writing to the autonegotiation forced mode bit
(AN_FRC_MODE_EN).
The desired test mode can now be selected by writing the ap-
propriate value to the 10BASE-T1L test mode control register
(B10L_TEST_MODE_CNTRL) and exiting the device from power-
down by clearing the software power-down bit (CRSM_SFT_PD).
Accessing Transmit Disable Test Mode
To configure the ADIN1110 in the transmit disable test mode, the
device must be in software power-down mode (CRSM_SFT_PD).
The power-down status of the ADIN1110 can be checked reading
the software power-down status bit (CRSM_SFT_PD_RDY).
When the ADIN1110 is in software power-down mode, disable
autonegotiation by clearing the autonegotiation enable bit (AN_EN).
With autonegotiation disabled, force the autonegotiation con-
figuration by writing to the autonegotiation forced mode bit
(AN_FRC_MODE_EN).
The transmit disable test mode can now be enabled by setting the
B10L_TX_DIS_MODE_EN bits to 1. To exit from the test mode,
write 0 to CRSM_SFT_PD.



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