MAX19527 Evaluation Kit

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Input/Output/Clock Tab

Output Format

The Output_ Format group box contains several func-

tions that format the output data.

The Reverse_ Bit_ Order checkbox allows the user to

change the LVDS output data to a MSB-first format

and displays the bit-order configuration. The Format

checkbox configures the output data format to binary or

two’s complement, and displays the current data format.

The Test_Data_Level drop-down list gives the user the

option of configuring the ADC’s OUT1–OUT8 channels

to display the normal LVDS data outputs, or setting the

channel’s outputs to a static high or low state.

Data Test Pattern

The Test_Data drop-down list gives the user the option

to choose between normal and test data modes. Select

Normal from the drop-down list to operate the LVDS

outputs under normal conditions. In normal operation,

all GUI functions in the Data_ Test_ Pattern group box

(with the exception of the Test_Data drop-down list) are

disabled. When Pattern is selected, all GUI functions in

the Data_Test_Pattern group box become active.

The Test_ Pattern drop-down list allows the user to

choose between several test patterns for data-timing

alignment. Selecting Normal from the Test_ Data drop-

down list configures the test pattern channels according

to the option selected in the Test_Data_Level drop-down

list. Selecting Pattern from the Test_Data drop-down list

allows the user to generate factory test and custom pat-

terns at the output channels. See Table 2 for generating

the IC test patterns.

Three buttons (WriteCUSTOM1, WriteCUSTOM2, and

WriteCUSTOM1-2) and their respective edit boxes also

become active when Pattern is selected from the Test_

Data drop-down list. The buttons are available for load-

ing customized 8-bit test patterns in the ADC’s 0x07,

0x08, and 0x09 registers. The registers are updated

by pressing the WriteCUSTOM1, WriteCUSTOM2, or

WriteCUSTOM1-2 buttons.

LVDS Output Adjustments

The LVDS_ Output_ Adjustments group box contains

controls to set the channel OUT1–OUT8 common-mode

output voltage, output current, and back termination.

The CM_Adjust drop-down list sets the output driver’s

common-mode voltage. The Current_Adjust drop-down

list sets the output driver’s current. The Termination

drop-down list sets the termination resistance.

Input Common-Mode Voltage

When checked, the SELF checkbox applies a common-

mode voltage to the ADC’s IN_+/IN_- input pins and

disables the common-mode input pins when not select-

ed. The Adjust drop-down list sets the common-mode

voltage according to the value selected. The selected

common-mode voltage can be monitored through the

CMOUT test point. When enabling SELF, verify that

shunts are not installed on jumpers JU1–JU8

System Timing

The Test_ FRAME_ Level drop-down list gives the user

the option of configuring the ADC’s FRAME LVDS output

channel to display the normal FRAME output frequency

(identical to input clock frequency), or setting the FRAME

output to a static high or low state.

The CLK_ Controls group box contains controls for

manipulating the input clock signal. The PLL_Frequency_

drop-down list programs the clock multiplier for the inter-

nal PLL in order to set the sampling frequency range.

Ensure that the input clock frequency, applied at the

EV kit CLK SMA connector, falls between the selected

minimum and maximum frequency in the drop-down list.

The Output_Phase drop-down list adjusts the phase of

the serial LVDS output clock (CLKOUT), relative to the

output data frame. Refer to the timing diagrams in the

MAX19527 IC data sheet for additional information.

The Test_CLKOUT_Level drop-down list gives the user

the option of configuring the ADC’s CLKOUT LVDS

output channel to display the normal CLKOUT signal, or

setting the output signal to a static high or low state.

The 100_ Ohm_ Input_ Term checkbox switches 100I

across differential clock inputs when checked.

Table_2._Test_Pattern_Selection

TEST_

PATTERNS

OUTPUT

Skew

(010101010101) à repeats every frame

SYNC

(111111000000) à repeats every frame

Custom

Custom test pattern à repeats every two

frames

Ramp

12-bit ramp from 0 to 4095 and repeats

Pseudo9

Pseudorandom data pattern

Pseudo23

Pseudorandom data pattern