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SWIXO7S0E Folha de dados(PDF) 8 Page - Seoul Semiconductor |
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SWIXO7S0E Folha de dados(HTML) 8 Page - Seoul Semiconductor |
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8 / 22 page ![]() R0.00 January 9, 2020 www.seoulsemicon.com Product Data Sheet SWIXO7S0E – WICOP 8 Reliability Test Item Symbol Condition Criteria for Judgment MIN MAX Forward Voltage V F I F =100mA I.V. *1 × 1.1 Luminous Flux ФV I F =100mA Flux × 0.7 Table 1. TEST ITEMS AND RESULTS Table 2. Criteria for Judging the Damage Item Reference Test Condition Duration / Cycle Number of Damage Room Temperature Operating Test - T a = 25℃, IF = 100mA 1,000 Hours 0/20 High Temperature Operating Test 1 - T a = 60℃, IF = 100mA 1,000 Hours 0/20 High Temperature Operating Test 2 - T a = 85℃, IF = 100mA 1,000 Hours 0/20 Wet High Temperature Operating Life(WHTOL) - Ta = 60℃, RH = 90% If = 100 mA 1,000hours 0/20 ESD Test - 2kV @ R1:10M Ω, R2:1.5KΩ, C:100pF 3 time 0/20 |
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