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NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to

absolute maximum rating conditions for extended periods may affect reliability.

Parameter

Limits

Unit

Min

Typical

Max

Sector erase and verify-1 time (excludes 00h programming prior to erase)

-

1.0

-

sec

Byte program time

-

45

-

µs

Chip programming time

-

23

-sec

Erase/program cycles

-

-

10,000

cycles

Parameter

Min

Max

Unit

-1.0

+13.0

V

-1.0

V

Current

-100

+100

mA

Parameter

Symbol

Min

Max

Unit

Input voltage (Input or DQ pin)

–2.0

+7.0

V

–2.0

+13.0

V

Power supply voltage

-0.5

+5.5

V

Operating temperature

–55

+125

°C

Storage temperature (plastic)

–65

+125

°C

Short circuit output current

-200

mA

100 pF*

Device under Test

*including scope

and jig capacitance

Test condition

Unit

Output load

1 TTL gate

Input rise and fall times

5

ns

Input pulse levels

0.0-3.0

V

Input timing measurement reference levels

1.5

V

Output timing measurement reference levels

1.5