PCMF2DFN1_PCMF3DFN1

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© NXP Semiconductors N.V. 2014. All rights reserved.

Product data sheet

Rev. 2 — 28 April 2014

5 of 14

NXP Semiconductors

PCMF2DFN1; PCMF3DFN1

Common-mode EMI filter for differential channels with ESD protection

The device uses an advanced clamping structure showing a negative dynamic resistance.

This snap-back behavior strongly reduces the clamping voltage to the system behind the

ESD protection during an ESD event. Do not connect unlimited DC current sources to the

data lines to avoid keeping the ESD protection device in snap-back state after exceeding

breakdown voltage (due to an ESD pulse for instance).

Fig 1.

Dynamic resistance with positive clamping;

typical values

Fig 2.

Dynamic resistance with negative clamping;

typical values

Fig 3.

Dynamic resistance with positive clamping;

typical values

Fig 4.

Dynamic resistance with negative clamping;

typical values

3.0

5.5

5.0

4.0

4.5

3.5

aaa-007659

3

2

4

5

(A)

1

-5

-1

-2

-4

-3

aaa-007660

-5

-3

-1

(A)

-7