24010 pdf, 24010 Descrição Electrónicos, 24010 Folha de dados, 24010 view ::: ALLDATASHEET :::

Nome de Peças	24010

Descrição Electrónicos	Machined High-Frequency Center Probe Test Socket for BGA, CSP, & MLF Packages

Tamanho do Arquivo	1930.75 Kbytes

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Fabricante Electrônico	ARIES [Aries Electronics, Inc.]

Página de início	http://www.arieselec.com

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Nº de peça semelhante - 24010

Fabricante Electrônico	Nome de Peças	Folha de dados	Descrição Electrónicos
Toshiba Semiconductor	24010001	2Mb / 44P	COLOR TELEVISION Jun. 2002
Toshiba Semiconductor	24010001	9Mb / 109P	COLOR TELEVISION N2PS Chassis Jun. 2002
Integrated Technology F...	240102B	204Kb / 5P	SAW Bandpass Filter 2005-11-15
Integrated Technology F...	240103B	164Kb / 5P	SAW Bandpass Filter 2008-04-23
PHOENIX CONTACT	24010400	65Kb / 4P	Passive module - FLKM-4FLK14/DI/S7-321/PLC

Fabricante Electrônico	Nome de Peças	Folha de dados	Descrição Electrónicos
Agilent(Hewlett-Packard...	W2635A	538Kb / 11P	BGA Probe Adapter for Infiniium Oscilloscopes
Integrated Device Techn...	932SQ420D	435Kb / 28P	64-pin TSSOP and MLF packages
Aries Electronics, Inc.	23023	3Mb / 3P	CSP Test Socket for Optical Laser Failure Analysis w/Emission Microscopy
	24008	2Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 13mm Square
	24009	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 27mm Square
	24009-APP	2Mb / 2P	High-Frequency Center Probe Test Socket with Adj. Pressure Pad for Devices up to 27mm Sq
	24011	2Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 40mm Square
	24012	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 55mm Square
	24013	1Mb / 2P	High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square
	24014	3Mb / 3P	CSP Test Socket for Optical Laser Failure Analysis Emission Microscopy