| Fabricante Electrônico | Nome de Peças | Folha de dados | Descrição Electrónicos |
 Aries Electronics, Inc. |
24-6556-10
|
705Kb / 2P |
Universal Test Socket Receptacle
|
 Abracon Corporation |
AXS-1147-02-02
|
419Kb / 1P |
CRYSTAL TEST & BURN IN SOCKET
08.21.09 |
|
AXS-1155-04-01
|
410Kb / 1P |
CRYSTAL TEST & BURN-IN SOCKET
07.10.09 |
|
AXS-2520-04-01
|
403Kb / 1P |
CRYSTAL OSCILLATOR TEST & BURN IN SOCKET
07.10.09 |
 Aries Electronics, Inc. |
10003
|
829Kb / 2P |
Universal Test Socket Receptacle
|
|
10010
|
1Mb / 2P |
Universal PLCC ZIF Test Socket
|
|
10012
|
529Kb / 1P |
Universal PLCC ZIF Test Socket
|
|
10015
|
766Kb / 1P |
Zero-Insertion-Force Test Socket
|
|
23022
|
1Mb / 2P |
Kelvin Test Socket
|
|
18108
|
1Mb / 1P |
Test Socket Breakout Board
|