■ High-performance, EEPROM-based programmable logic devices
(PLDs) based on second-generation MAX® architecture
■ 5.0-V in-system programmability (ISP) through the built-in
IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface available in
MAX 7000S devices
– ISP circuitry compatible with IEEE Std. 1532
■ Includes 5.0-V MAX 7000 devices and 5.0-V ISP-based MAX 7000S
devices
■ Built-in JTAG boundary-scan test (BST) circuitry in MAX7000S
devices with 128 or more macrocells
■ Complete EPLD family with logic densities ranging from 600 to
5,000 usable gates (see Tables 1 and 2)
■ 5-ns pin-to-pin logic delays with up to 175.4-MHz counter
frequencies (including interconnect)
■ PCI-compliant devices available