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ST7MC2S4-Auto Folha de dados(PDF) 184 Page - STMicroelectronics

Nome de Peças ST7MC2S4-Auto
Descrição Electrónicos  Clock, reset and supply management
PDF  371 Pages
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Fabricante Electrônico  STMICROELECTRONICS [STMicroelectronics]
Página de início  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST7MC2S4-Auto Folha de dados(HTML) 184 Page - STMicroelectronics

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On-chip peripherals
ST7MC1K2-Auto, ST7MC1K6-Auto, ST7MC2S4-Auto, ST7MC2S6-Auto
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The end of demagnetization event (D), is also detected by the MTC or simulated with a timer
compare feature when no detection is possible.
The MTC manages these three events always in the same order: Z generates C after a
delay computed in realtime, then waits for D in order to enable the peripheral to detect
another Z event.
The BEMF zero-crossing event (Z), can also be detected by the MTC or simulated with a
timer compare feature when no detection is possible.
The speed regulation is managed by the microcontroller, by means of an adjustable
reference current level in case of current control, or by direct PWM duty-cycle adjustment in
case of voltage control.
Figure 74.
Chronogram of events (in autoswitched mode)
CH event
ZH or ZS event
Cn processing
Wait for Cn
T
Zn
Cn
t
Wait for Dn
DH event
Dn
DS event
Wait for Z
VDD
VSS
P signal when sampled
(output of the analog MUX)
VREF
(threshold value for
Voltage on phase A
Voltage on phase B
Voltage on phase C
Input comparator)
BEMF
sampling
Obsolete
Product(s)
- Obsolete
Product(s)



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