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STM32F412RG Folha de dados(PDF) 133 Page - STMicroelectronics

Nome de Peças STM32F412RG
Descrição Electrónicos  ARM-Cortex-M4 32b MCUFPU, 125 DMIPS, 1MB Flash, 256KB RAM, USB OTG FS, 17 TIMs, 1 ADC, 17 comm. interfaces
PDF  193 Pages
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Fabricante Electrônico  STMICROELECTRONICS [STMicroelectronics]
Página de início  http://www.st.com
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STM32F412RG Folha de dados(HTML) 133 Page - STMicroelectronics

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STM32F412xE/G
Electrical characteristics
161
QSPI interface characteristics
Unless otherwise specified, the parameters given in the following tables for QSPI are
derived from tests performed under the ambient temperature, fAHB frequency and VDD
supply voltage conditions summarized in Table 15, with the following configuration:
•
Output speed is set to OSPEEDRy[1:0] = 11
•
Capacitive load C=20pF
•
Measurement points are done at CMOS levels: 0.5VDD
Refer to Section 6.3.16: I/O port characteristics for more details on the input/output alternate
function characteristics.
Table 66. QSPI dynamic characteristics in SDR mode(1)
1. Guaranteed by characterization results, not tested in production.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fSCK
1/tc(SCK)
QSPI clock
frequency
Write mode
1.71 V≤VDD≤3.6 V
Cload = 15 pF
--
80
MHz
Read mode
2.7 V<VDD<3.6 V
Cload = 15 pF
-
-
100
1.71 V≤VDD≤3.6 V
-
-
50
tw(CKH)
QSPI clock high
and low
-
(T(CK) / 2)-1
-
T(CK) / 2
ns
tw(CKL)
T(CK) / 2)
-
(T(CK) / 2)+1
ts(IN)
Data input setup
time
-0.5
-
-
th(IN)
Data input hold
time
-
3.5
-
-
tv(OUT)
Data output valid
time
--
1
1.5
th(OUT)
Data output hold
time
-0.5
-
-
Table 67. QSPI dynamic characteristics in DDR mode(1)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fSCK
1/tc(SCK)
QSPI clock
frequency
Write mode
1.71 V≤VDD≤3.6 V
Cload = 15 pF
--
80
MHz
Read mode
2.7 V<VDD<3.6 V
Cload = 15 pF
-
-
80
1.71 V≤VDD≤3.6 V
-
-
50



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