ATmega32HVB datasheet(231/273 Pages) ATMEL

231 / 273 page

231

8042A–AVR–07/09

ATmega16HVB/32HVB

3. The measured VPTAT voltage must be scaled with the calibration value stored in the VPTAT Calibration Register to get the

absolute temperature. The design target accuracy for this parameter assumes an exact calibration temperature. Actual

accuracy of this parameter after calibration in Atmel factory test remains to be determined.

32.7

ADC Characteristics

32.7.1

Voltage ADC Characteristics

Notes:

1. Value is after Atmel factory offset and gain compensation in production (for details, see Table 29-3, “Signature Row

Addressing.,” on page 199) and it includes drift over the whole temperature range.

2. Value not tested in production but guarantied by design and characterization.

Table 32-6.

A= -40 to 85°C unless otherwise noted.

Parameter

Condition

Min

Typ

Max

Unit

Conversion Time

clkVADC = 1 MHz

519

μs

Resolution

Bits

Gain ADC0/1 (Un-scaled)

263

μV/LSB

Gain Cell Inputs (x0.2)

1.42

mV/LSB

INL(2)

ADC0, ADC1

±1

±3

LSB

CELL1, CELL2, CELL3

±1

±3

CELL4

±2

±5

Input Voltage range ADC0, ADC1, VTEMP

Input Voltage range CELL1

1.8

Input Voltage range CELL2

VPV1-GND>1.8V

Input Voltage range CELL3

VPV2-GND>1.8V

Input Voltage range CELL4

PV3-GND>1.8V

Offset drift(1)(2)

ADC0, ADC1

LSB

CELL1, CELL2, CELL3

CELL4

Gain drift(1)(2)

ADC0, ADC1

LSB

CELL1, CELL2, CELL3

CELL4

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