AT83C5136-RDTUL datasheet(145/171 Pages) ATMEL

145 / 171 page

145

AT83C5134/35/36

7683B–USB–03/07

Notes:

1. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure 73.), VIL =

VSS + 0.5V,

VIH = VCC - 0.5V; XTAL2 N.C.; EA = RST = Port 0 = VCC. ICC would be slightly higher if a crystal oscillator used (see Figure

70.).

2. Idle ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL = VSS + 0.5V, VIH = VCC -

0.5V; XTAL2 N.C; Port 0 = VCC; EA = RST = VSS (see Figure 71).

3. Power-down ICC is measured with all output pins disconnected; EA = VCC, PORT 0 = VCC; XTAL2 NC.; RST = VSS (see Fig-

ure 72.). In addition, the WDT must be inactive and the POF flag must be set.

4. Capacitance loading on Ports 0 and 2 may cause spurious noise pulses to be superimposed on the VOLS of ALE and Ports 1

and 3. The noise is due to external bus capacitance discharging into the Port 0 and Port 2 pins when these pins make 1 to 0

transitions during bus operation. In the worst cases (capacitive loading 100 pF), the noise pulse on the ALE line may exceed

0.45V with maxi VOL peak 0.6V. A Schmitt Trigger use is not necessary.

5. Typicals are based on a limited number of samples and are not guaranteed. The values listed are at room temperature.

6. Under steady state (non-transient) conditions, IOL must be externally limited as follows:

Maximum IOL per port pin: 10 mA

Maximum IOL per 8-bit port:

Port 0: 26 mA

Ports 1, 2 and 3: 15 mA

Maximum total IOL for all output pins: 71 mA

If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater

than the listed test conditions.

Figure 70. ICC Test Condition, Active Mode

PFDM

Power Fail Low Level Threshold

2.2

Power fail hysteresis V

PFDP - VPFDM

0.15

Symbol

Parameter

Min

Typ(5)

Max

Unit

Test Conditions

(NC)

CLOCK

SIGNAL

All other pins are disconnected.

RST

XTAL2

XTAL1

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