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AM652X Folha de dados(PDF) 269 Page - Texas Instruments |
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AM652X Folha de dados(HTML) 269 Page - Texas Instruments |
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269 / 277 page ![]() 269 AM6548, AM6528, AM6546 AM6526, AM6527 www.ti.com SPRSP08I – NOVEMBER 2017 – REVISED DECEMBER 2019 Submit Documentation Feedback Product Folder Links: AM6548 AM6528 AM6546 AM6526 AM6527 Device and Documentation Support Copyright © 2017–2019, Texas Instruments Incorporated 8.5 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 8.6 Trademarks SafeTI, Sitara, Code Composer Studio, E2E are trademarks of Texas Instruments. Neon, CoreSight are trademarks of Arm Limited (or its subsidiaries) in the US and/or elsewhere. Arm, Cortex, TrustZone are registered trademarks of Arm Limited (or its subsidiaries) in the US and/or elsewhere. EtherCAT is a registered trademark of Beckhoff Automation GmbH. PowerVR is a registered trademark of Imagination Technologies Limited. MIPI is a registered trademark of MIPI Alliance, Inc. HyperBus is a trademark of Mobiveil Inc. Multimedia Card, MMC, eMMC are trademarks of MultiMediaCard Association. I2C is a trademark of NXP Semiconductors. PCI-Express, PCIe are registered trademarks of PCI-SIG. Secure Digital, SD are registered trademarks of SD Card Association. All other trademarks are the property of their respective owners. 8.7 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 8.8 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. |
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