| Fabricante Electrônico | Nome de Peças | Folha de dados | Descrição Electrónicos |

Keysight Technologies
|
U2941A |
1Mb/6P |
Parametric Test Fixture |
| 4082A |
297Kb/21P |
Parametric Test System |

Bel Fuse Inc.
|
0804-EVALB02 |
2Mb/11P |
Powerline Test Fixture |

Keysight Technologies
|
E6708A |
98Kb/4P |
RF Parametric and Functional Test |

Agilent(Hewlett-Packard...
|
N9201A |
115Kb/4P |
Array Structure Parametric Test Option |

Keysight Technologies
|
4082F |
324Kb/23P |
Flash Memory Cell Parametric Test System |

Agilent(Hewlett-Packard...
|
U7242A |
187Kb/2P |
Transmitter and Receiver Test Fixture |

Keysight Technologies
|
16197A |
53Kb/1P |
Bottom Electrode SMD Test Fixture |

SIRENZA MICRODEVICES
|
SDM-EVAL |
159Kb/3P |
Test Fixture for Sirenza SDM Module Series |
| XD010-EVAL |
156Kb/3P |
Test Fixture for Sirenza XD Module Series |

Sanyo Semicon Device
|
LV3100M |
425Kb/9P |
Parametric Equalizer |

Texas Instruments
|
DEM-ADS1216 |
336Kb/9P |
EVALUATION FIXTURE |
| DEM-DAI1602 |
209Kb/11P |
EVALUATION FIXTURE |

Burr-Brown (TI)
|
DEM-OPA68XU |
59Kb/4P |
EVALUATION FIXTURE |

Sanyo Semicon Device
|
LC75281E |
176Kb/10P |
Parametric Equalizer System |

Burr-Brown (TI)
|
DEM-DAI1604 |
157Kb/11P |
EVALUATION FIXTURE |
| DEM-ADS7843E |
285Kb/13P |
EVALUATION FIXTURE |
| DEM-PCM1704 |
100Kb/5P |
EVALUATION FIXTURE |
| DEM-DAI1742 |
281Kb/10P |
EVALUATION FIXTURE |

Molex Electronics Ltd.
|
0690202025 |
36Kb/1P |
Arbor Press Fixture |